Section: New Results

Test Case Generation for Concurrent Systems Using Event Structures

In [23] we deal with the test-case generation problem for concurrent systems that are specified by true-concurrency models such as Petri nets. We show that using true-concurrency models reduces both the size and the number of test cases needed for achieving certain coverage criteria. We present a test-case generation algorithm based on Petri net unfoldings and a SAT encoding for solving controllability problems in test cases. Finally, we evaluate our algorithm against traditional test-case generation methods under interleaving semantics.